Microscope Accessories and Replacement Parts
General accessories and parts for use with microscopes. Products include lens oil, lens cleaner, slide dispensers, microscope covers, vessel holders, light cubes, and flow cells.
Many parts of your microscope can be updated or replaced including microscope lamps, lenses, and eyepieces. Replacement lamps, light sources, and power cords can extend the working lives of your microscopy equipment. New or replacement objectives and lenses can help increase the total magnification available with your microscope.
Add greater magnification or exchange your eyepiece for one with a reticule to more easily estimate the sizes of the items being viewed.
Replace or update your mechanical stage or clamps or add cell culture vessel adapters to facilitate specimen positioning.
Condensers can also be replaced, and conversion kits are available to add phase contrast, polarization, fluorescence, or other capabilities to your current system.
Some microscopes can be adapted for use with still or video cameras. Look for cameras and adapters designed for your specific microscope brand. Film and documentation-related products may also be available to support your record-keeping.
Temporary, semi-permanent, and more long-term slide storage options include:
- Slide racks that securely hold slides during staining procedures
- Folding fiberboard or plastic slide holders with horizontal indentations that keep microscope slides in place
- Slide storage boxes with vertical dividers; made from fiberboard, plastic, and wood and available in multiple sizes
- Slide holders and mailers for transporting slides safely
- Slide storage systems and cabinets for large quantities of slides or archival storage
Electron Microscopy Sciences C-Flat™ Holey Carbon Grid CF-2/4-4C, 400 mesh Cu
C-flat is an ultra-flat, holey carbon-coated support grid for transmission electron microscopy (TEM). Unlike competing holey carbon films, C-flat is manufactured without plastics, so it is clean upon arrival and the user has no residue to contend with. Made with patent pending technology, C-flat provides an ultra-flat surface that results in better particle dispersion and more uniform ice thickness.
Patterning is done using deep-UV projection lithography, ensuring the most accurate and consistent hole shapes and sizes down to submicron features. The precise methods by which C-flat is manufactured elminate artifacts such as excess carbon and edges around holes.
C-flat holey carbon grids provide the ideal specimen support to achieve high resolution data in making them an ideal choice for cryo single particle analysis, cryo tomography and automated TEM analysis. 2.0 µm holes with 4.0 µm spacing.
Mesh: 400
Material: Copper
Electron Microscopy Sciences Porton Graticle NG2, 21mm
The circle areas of the Porton greaticules increases with Root 2 progression as do the divisions on the right hand side of the rectangle. These divisions are numbered for convenience. The rectangle size is 4.5 mm x .25 mm. Circle sizes in microns are 560, 400, 280, 200, 140, 100, 70, 50, and 35. The specimen is racked on the mechanical stage of the microscope and traverses are taken right across thee deposit sizing all the particles encountered.
Size: 21mm
Surface: Chrome image
Electron Microscopy Sciences Embra Grid with 2 x 1 mm slot, Aluminum
EMBRA electroformed grids combine a high open area with a rigid construction which allows for relatively easy handling. 3.05 mm diameter, 50 micron thick for oval hole grids.
I.D.: 2 x 1 mm
Material: Aluminum
Electron Microscopy Sciences Veco Square Mesh Handle 300 mesh Nickel Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter.
Grid: Nickel
Pitch: 83 µm
Hole: 45 µm
Bar: 38 µm
Electron Microscopy Sciences Broken Crosslines Microscope Graticle NE56, 16mm, Broken line
For measurement of large objects in conjunction with a graduated mechanical stage. Measurements in two directions and for sighting and alignment. Broken lines enable fine detail to be seen at the breaks. A thin boundary would be lost behind a a continuous line. Image covers the entire field of view. Surface chrome image.
Size: 16mm
Divisions: Broken line
Bulbman Inc SM-8C102 Ushio 8000299 6-8V 30W
6-8 Volt - 30-40 Watt Incandescent Bulb - Special Metal/plast.base Micoscope Bulb
Electron Microscopy Sciences Veco Square Mesh Handle 200 mesh Nickel Grid
Veco Grids offer superior handling characteristics. Plus, with a 0.8 mil thickness, Veco Grids are the most rigid grids available. 3.05 mm diameter.
Grid: Nickel
Pitch: 125 µm
Hole: 85 µm
Bar: 40 µm
Electron Microscopy Sciences Maxtaform 300 mesh, Gold
Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness.
Grid: Gold
Pitch: 84 µm
Hole: 61 µm
Bar: 23 µm
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Electron Microscopy Sciences Maxtaform 300 mesh, Nickel
Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness.
Grid: Nickel
Pitch: 84 µm
Hole: 61 µm
Bar: 23 µm
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Electron Microscopy Sciences Maxtaform 100 Mesh, Nickel
Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness.
Grid: Nickel
Pitch: 254 µm
Hole: 213 µm
Bar: 41 µm
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Electron Microscopy Sciences Maxtaform 200 mesh, Gold
Maxtaform grids with clean and smooth edges, firm support, and a large open area. 3 mm diameter, 0.75 mil thickness.
Grid: Gold
Pitch: 127 µm
Hole: 103 µm
Bar: 24 µm
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Electron Microscopy Sciences Carbon Rods, ⅛" diameter, 12" OAL
Technical grade has a typical impurity level of 50ppm or greater and may be used in applications of non critical SEM coating applications.
Diameter: 1/8"
OAL: 12"
Electron Microscopy Sciences Chessy Test Specimen
This precise SEM calibration specimen consist of more than 1.6 million gold squares of 1 size on silicon forming a 4-fold checkerboard pattern in an area of 5 mm square. The smallest metric checkerboard has a size of 10 x 10. Such checkerboards form larger metric checkerboards of 100 x 100 - These again form checkerboards of 1 mm square. Finally, such 1mm squares are arranged in the same manner covering a field of 5 mm square.
The edges of the empty corners in 0.1 and 1 mm checkerboards are additionally marked. The surrounding frame is 10 wide and has an outer side length of 5.04 mm. The pattern was directly written by e-beam lithography using the new ZBA 31/32 from JENOPTIK.
Electron Microscopy Sciences Broken Crosslines Microscope Graticle NE56, 19mm, Broken line
For measurement of large objects in conjunction with a graduated mechanical stage. Measurements in two directions and for sighting and alignment. Broken lines enable fine detail to be seen at the breaks. A thin boundary would be lost behind a a continuous line. Image covers the entire field of view. Surface chrome image.
Size: 19mm
Divisions: Broken line
Electron Microscopy Sciences JEOL JSM 840 SEM Cylinder Mount 1/2" surface, 1/4" height, Carbon
Cylinder specimen mounts are for use with JEOL JSM-840 scanning electron microscopes. The mounts are made from spectroscopically pure carbon.
Head: 1/2"
Height: 1/4"